A Broadband Quasi-optical System for Measuring the Dielectric Properties in the Terahertz Band
Liu Xiaoming①,* Yu Junsheng② Chen Xiaodong③ Zhou Jun④ Gan Lu① Zhang Chijian①
①(Laboratory of Millimetre Wave and Terahertz Technologies, College of Physics and Electronic Information, Anhui Normal University, Wuhu 241002, China) ②(School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China) ③(School of Electronic Engineering and Computer Science, Queen Mary University of London, London E1 4NS, UK) ④(School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China)
Abstract：To fulfill the requirements of the dielectric property measurement in the terahertz band, herein, a broadband quasi-optical system was designed and verified utilizing a planar scanning system. Additionally, the method of retrieving the dielectric parameters was discussed. Our experimental findings indicated that the measurement results were in good agreement with the theoretical results. Boron silicon, and deionized water were used for verifying the measurement, and the permittivity was obtained using a numerical method. We found that the dielectric properties were in good agreement with the typical values. This indicated that the proposed quasi-optical method effectively characterized the permittivity.
刘小明, 俞俊生, 陈晓东, 周 俊, 甘 露, 张持建. 针对太赫兹波段介电参数测量的宽带准光系统[J]. 雷达学报, 2018, 7(1): 56-66.
Liu Xiaoming, Yu Junsheng, Chen Xiaodong, Zhou Jun, Gan Lu, Zhang Chijian. A Broadband Quasi-optical System for Measuring the Dielectric Properties in the Terahertz Band. JOURNAL OF RADARS, 2018, 7(1): 56-66.
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2018, Vol. 7 
